@inproceedings{3370c8bade1b4e489bbd9a9dc875ed63,
title = "Bipolar applied field experiments to characterize dielectric relaxation and describe charge transport in low-k materials",
abstract = "TDDB model • Depict interaction between electron, intrinsic defects and ionic species • Provide physical description of failure mechanisms • Adequate prediction for dielectric breakdown.",
author = "Juan Borja and Plawsky, {Joel L.} and Lu, {T. M.} and Gill, {William N.}",
year = "2012",
language = "Ingl{\'e}s",
isbn = "9781622769995",
series = "Advanced Metallization Conference (AMC)",
pages = "196--203",
booktitle = "Advanced Metallization Conference 2012",
note = "null ; Conference date: 09-10-2012 Through 11-10-2012",
}