Abstract
In this section a set of dynamic applied field experiments are presented. We designed these experiments to study intrinsic and metal-catalyzed failure. Techniques such as ramped voltage sweeps and bipolar applied field tests are utilized to characterize fundamental aspects of breakdown in thin low-κ films. We studied intrinsic breakdown using inert (Au) and self-limiting electrodes (Al). Metal-catalyzed failure was investigated by employing reactive electrodes such as Cu and Ag, and we present a model for the transport of ionic species and their impact on dielectric failure. The motion of ions is correlated with field form, polarity, and magnitude. This chapter concludes with a brief discussion of the impact of plasma treatments and moisture on dielectric breakdown and its fundamental failure mechanisms.
Original language | English |
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Title of host publication | SpringerBriefs in Materials |
Publisher | Springer |
Pages | 37-57 |
Number of pages | 21 |
DOIs | |
State | Published - 2016 |
Externally published | Yes |
Publication series
Name | SpringerBriefs in Materials |
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ISSN (Print) | 2192-1091 |
ISSN (Electronic) | 2192-1105 |
Bibliographical note
Publisher Copyright:© 2016, The Author(s).
Keywords
- Bipolar field
- Copper
- Dielectric breakdown
- Electrode
- Ion
- Metal
- Moisture
- Plasma damage
- Ramped voltage
- Reactive