Reconsidering Conventional Field Acceleration Models

Juan Pablo Borja, Toh Ming Lu, Joel Plawsky

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

Abstract

The theory developed in the previous chapters can be useful for understanding the role of charge species in dielectric breakdown. However, a more attractive feature of the model developed in Chap. 7 rests on its ability to make predictions on dielectric breakdown at low fields from data collected at high fields without needing to use empirical field acceleration formulas. In this chapter, we discuss estimates from the model and compare these with predictions from conventional field acceleration fits. The objective is to establish which empirical expression replicates this complex phenomenon the best. In essence, fundamental concepts ought to drive the predictions, not the other way around.

Original languageEnglish
Title of host publicationSpringerBriefs in Materials
PublisherSpringer
Pages99-105
Number of pages7
DOIs
StatePublished - 2016
Externally publishedYes

Publication series

NameSpringerBriefs in Materials
ISSN (Print)2192-1091
ISSN (Electronic)2192-1105

Bibliographical note

Publisher Copyright:
© 2016, The Author(s).

Keywords

  • Charge transport
  • Dielectric breakdown
  • Electron
  • Field acceleration
  • Intrinsic failure
  • Mechanism
  • Metal ion
  • Model
  • Operating conditions
  • Traps

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