Using correctness, consistency, and completeness patterns for automated scenarios verification

Edgar Sarmiento Calisaya, Julio Cesar Sampaio Do Prado Leite, Eduardo Almentero

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

Abstract

Scenario-based approaches are often used for Software Requirements Specification (SRS). Since scenarios are usually written in natural language, they may be ambiguous and, sometimes, inaccurate, which impair requirements quality. One of the major factors for this problem is because interactions among scenarios are seldom represented explicitly. As such, the importance of correctness, consistency and completeness, in the context of scenario-based representations should be rethought. In this paper, we employ the NFR approach to organize the non-functional requirements related to correctness, consistency and completeness as a catalog of non-functional requirements (NFR). We represent the initial catalog as non-functional requirements patterns. These initial patterns can be effectively used for automated scenario-based SRS verification. The identified patterns can be operationalized by evaluating properties related to these NFRs. We demonstrate the applicability of this catalog by instantiating it to the evaluation of an SRS based on a scenario language.

Original languageEnglish
Title of host publication5th International Workshop on Requirements Patterns, RePa 2015 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages47-54
Number of pages8
ISBN (Electronic)9781509001224
DOIs
StatePublished - 16 Feb 2016
Externally publishedYes
Event5th International Workshop on Requirements Patterns, RePa 2015 - Ottawa, Canada
Duration: 25 Aug 2015 → …

Publication series

Name5th International Workshop on Requirements Patterns, RePa 2015 - Proceedings

Conference

Conference5th International Workshop on Requirements Patterns, RePa 2015
Country/TerritoryCanada
CityOttawa
Period25/08/15 → …

Bibliographical note

Funding Information:
Leite acknowledges the support from CNPq.

Publisher Copyright:
© 2015 IEEE.

Keywords

  • analysis
  • completeness
  • consistency
  • correctness
  • NFR
  • pattern
  • Petri-Net
  • requirements
  • scenario
  • verification

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